Advances in surface and thin film diffraction / Symposium...; ed. Ting C. Huang, Philip I. Cohen, David J. Eaglesham
Corporate Author (Main) Symposium [on] Advances in Surface and Thin Film Diffraction, Boston, Mass., 1990 Secondary Author Huang, Tin C.Cohen, Philip I.
Eaglesham, David J. Country Estados Unidos. Publication Pittsburgh : Materials Research Society, cop. 1991 Description XV, 367, [8] p. : il. ; 24 cm Series Materials Research Society symposium proceedings , 208) ISBN 1-55899-100-X CDU 538.975 535.42
| Item type | Current location | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|
| Monografia | Biblioteca Geral da Universidade do Minho | BGUMD 110601 | Available | 100025 |
Total holds: 0
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