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Applied survival analysis : regression modeling of time to event data / David W. Hosmer Jr., Stanley Lemeshow Monografia Publication New York : John Wiley & Sons, cop. 1999 Description XIII, 386 p. : il. gráficos ; 24 cm LocationBiblioteca da UMinho no Campus de Azurém, Biblioteca Geral da Universidade do Minho Availability Available (2).

Applied logistic regression / David W. Hosmer Jr., Stanley Lemeshow Monografia Publication New York : John Wiley & Sons, cop. 1989 Description XIII, 307 p. : il. ; 24 cm LocationBiblioteca Geral da Universidade do Minho Availability No copies available Checked out (1).