Applied logistic regression / David W. Hosmer Jr., Stanley Lemeshow
Main Author
Hosmer, David W.
Coauthor
Lemeshow, Stanley
Country
Estados Unidos.
Publication
New York : John Wiley & Sons, cop. 1989
Description
XIII, 307 p. :
il. ;
24 cm
Series
Wiley series in probability and mathematical statistics.. Applied probability and statistics section)
ISBN
0-471-61553-6
CDU
519.233.5
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