| 000 | 00707nam0a22002050004500 | ||
|---|---|---|---|
| 001 | 132640 | ||
| 005 | 20200804124243.0 | ||
| 010 |
_a3-540-59129-X _b(Encadernado) |
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| 090 | _a132640 | ||
| 100 | _a19970724d1996 k y0pory5003 ba | ||
| 101 | 0 | _aeng | |
| 102 | _aDE | ||
| 200 | 1 |
_aOptical charecterization of epitaxial semiconductor layers _fed. Günther Bauer, Wolfgang Richter |
|
| 210 |
_aBerlin _cSpringer _dcop. 1996 |
||
| 215 |
_aXIV, 429 p. _cil. _d25 cm |
||
| 675 |
_a538.9 _vint _zeng |
||
| 702 | 1 |
_914002 _aBauer, _bGünther _4340 |
|
| 702 | 1 |
_9149466 _aRichter, _bWolfgang _4340 |
|
| 942 |
_cLIVRO _n0 |
||