000 00632naa0a22001810004500
001 109334
005 20200804121501.0
090 _a109334
100 _a19960311d1993 k y0pory5003 ba
101 0 _aeng
102 _aGB
200 1 _aMicrotopographic inspection by optical triangulation
_fManuel F. M. Costa, José B. Almeida
461 _aSPIE : Optics as a Key to High Technology
_vV.1983 (1993), p. 948-949
675 _a535.8
_vmed
_zpor
700 1 _aCosta,
_bManuel F. M.
701 1 _93665
_aAlmeida,
_bJosé B.
_4070
942 _cLIVRO
_n0