Selected papers on optical methods in surface metrology / ed. David J. Whitehouse
Secondary Author Whitehouse, David J. Country Estados Unidos. Publication Bellingham : SPIE Optical Engineering Press, cop. 1996 Description XXI, 638 p. : il. ; 29 cm Series SPIE milestone series , MS 129) ISBN 0-8194-2347-5 CDU 620.1:389 389:620.1| Item type | Current location | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|
| Monografia | Biblioteca da UMinho no Campus de Azurém | BPG3 620.1:389 - S | Available | 202671 |
Total holds: 0
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