Advanced transmission electron microscopy : applications to nanomaterials / edited by Francis Leonard Deepak, Alvaro Mayoral, Raul Arenal
Secondary Author
Francis, Leonard Deepak
Mayoral, Alvaro
Arenal, Raul
Country
Suiça.
Publication
Cham : Springer International Publishing, cop. 2015
Description
XII, 272 p. :
il. ;
25 cm
ISBN
978-3-319-15176-2
CDU
621.385.833
537.533.35
57.086.2
620.1
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