Abramovici,, Miron
Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman
Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman
. - New York : IEEE Press, cop. 1990
. - XVIII, 652 p. : il. 26 cm
0-7803-1062-4 (Encadernado)
681.3.02