Abramovici,, Miron Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman

Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman . - New York : IEEE Press, cop. 1990 . - XVIII, 652 p. : il. 26 cm
0-7803-1062-4 (Encadernado)

681.3.02