Optical charecterization of epitaxial semiconductor layers / ed. Günther Bauer, Wolfgang Richter
Optical charecterization of epitaxial semiconductor layers / ed. Günther Bauer, Wolfgang Richter
. - Berlin : Springer, cop. 1996
. - XIV, 429 p. : il. 25 cm
3-540-59129-X (Encadernado)
538.9