Optical charecterization of epitaxial semiconductor layers / ed. Günther Bauer, Wolfgang Richter

Optical charecterization of epitaxial semiconductor layers / ed. Günther Bauer, Wolfgang Richter . - Berlin : Springer, cop. 1996 . - XIV, 429 p. : il. 25 cm
3-540-59129-X (Encadernado)

538.9