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The image processing handbook / John C. Russ

Main Author Russ, John C. Country Estados Unidos. Edition 2nd ed Publication Boca Raton : CRC Press, cop. 1995 Description 674 p. : il. color. ; 27 cm ISBN 0-8493-2516-1 CDU 681.3
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Holdings
Item type Current location Call number Status Date due Barcode Item holds
Monografia Biblioteca da UMinho no Campus de Azurém
BPG 681.3 - R Available 132677
Monografia Biblioteca da UMinho no Campus de Azurém
BPG 681.3 - R Available 142136
Monografia Biblioteca Geral da Universidade do Minho
BGUM 681.3 - R Perdido | Lost Indisponível | Not available 159001
Total holds: 0

Enhanced descriptions from Syndetics:

From the reviews of the First Edition:

Table of contents provided by Syndetics

  • 1 Acquiring Images (p. 1)
  • Human reliance on images for information (p. 1)
  • Video cameras (p. 6)
  • CCD cameras (p. 8)
  • Camera artefacts and limitations (p. 11)
  • Color cameras (p. 13)
  • Camera resolution (p. 15)
  • CMOS cameras (p. 17)
  • Focusing (p. 18)
  • Electronics and bandwidth limitations (p. 18)
  • Pixels (p. 20)
  • Grey-scale resolution (p. 23)
  • Noise (p. 24)
  • High-depth images (p. 26)
  • Color imaging (p. 30)
  • Digital camera limitations (p. 36)
  • Color spaces (p. 40)
  • Color correction (p. 47)
  • Color displays (p. 50)
  • Image types (p. 52)
  • Range imaging (p. 54)
  • Multiple images (p. 59)
  • Stereoscopy (p. 64)
  • Imaging requirements (p. 71)
  • 2 Printing and Storage (p. 79)
  • Printing (p. 79)
  • Dots on paper (p. 83)
  • Color printing (p. 88)
  • Printing hardware (p. 93)
  • Film recorders (p. 98)
  • File storage (p. 100)
  • Storage media (p. 101)
  • Magnetic recording (p. 103)
  • Databases for images (p. 104)
  • Browsing and thumbnails (p. 108)
  • Lossless coding (p. 111)
  • Reduced color palettes (p. 117)
  • JPEG compression (p. 118)
  • Wavelet compression (p. 123)
  • Fractal compression (p. 126)
  • Digital movies (p. 128)
  • 3 Correcting Imaging Defects (p. 131)
  • Contrast expansion (p. 131)
  • Noisy images (p. 137)
  • Neighborhood averaging (p. 140)
  • Neighborhood ranking (p. 152)
  • Other neighborhood noise-reduction methods (p. 162)
  • Defect removal, maximum entropy, and maximum likelihood (p. 167)
  • Nonuniform illumination (p. 171)
  • Fitting a background function (p. 174)
  • Rank leveling (p. 179)
  • Color shading (p. 181)
  • Non-planar views (p. 188)
  • Computer graphics (p. 189)
  • Geometrical distortion (p. 191)
  • Alignment (p. 193)
  • Interpolation (p. 197)
  • Morphing (p. 202)
  • 4 Image Enhancement (Processing in the Spatial Domain) (p. 207)
  • Contrast manipulation (p. 208)
  • Histogram equalization (p. 211)
  • Laplacian (p. 219)
  • Derivatives (p. 229)
  • The Sobel and Kirsch operators (p. 232)
  • Rank operations (p. 248)
  • Texture (p. 257)
  • Fractal analysis (p. 261)
  • Implementation notes (p. 263)
  • Image math (p. 264)
  • Subtracting images (p. 265)
  • Multiplication and division (p. 269)
  • 5 Processing Images in Frequency Space (p. 277)
  • Some necessary mathematical preliminaries (p. 277)
  • What frequency space is all about (p. 277)
  • The Fourier transform (p. 278)
  • Fourier transforms of real functions (p. 281)
  • Frequencies and orientations (p. 286)
  • Measuring images in the frequency domain (p. 286)
  • Orientation and spacing (p. 286)
  • Preferred orientation (p. 290)
  • Texture and fractals (p. 295)
  • Filtering images (p. 297)
  • Isolating periodic noise (p. 297)
  • Masks and filters (p. 303)
  • Selection of periodic information (p. 309)
  • Convolution and correlation (p. 314)
  • Fundamentals of convolution (p. 314)
  • Imaging system characteristics (p. 317)
  • Noise and Wiener deconvolution (p. 322)
  • Motion blur (p. 325)
  • Autocorrelation (p. 331)
  • Conclusion (p. 332)
  • 6 Segmentation and Thresholding (p. 333)
  • Thresholding (p. 333)
  • Multiband images (p. 336)
  • Two-dimensional thresholds (p. 338)
  • Multiband thresholding (p. 341)
  • Thresholding from texture (p. 346)
  • Multiple thresholding criteria (p. 349)
  • Textural orientation (p. 352)
  • Accuracy and reproducibility (p. 357)
  • Including position information (p. 359)
  • Selective histograms (p. 366)
  • Boundary lines (p. 367)
  • Contours (p. 370)
  • Image representation (p. 374)
  • Other segmentation methods (p. 377)
  • The general classification problem (p. 379)
  • 7 Processing Binary Images (p. 383)
  • Boolean operations (p. 383)
  • Combining Boolean operations (p. 387)
  • Masks (p. 389)
  • From pixels to features (p. 391)
  • Boolean logic with features (p. 397)
  • Selecting features by location (p. 402)
  • Double thresholding (p. 405)
  • Erosion and dilation (p. 409)
  • Opening and closing (p. 410)
  • Isotropy (p. 413)
  • Measurements using erosion and dilation (p. 417)
  • Extension to grey-scale images (p. 419)
  • Morphology neighborhood parameters (p. 420)
  • Examples of use (p. 421)
  • The custer (p. 425)
  • Euclidean distance map (p. 425)
  • Watershed segmentation (p. 429)
  • Ultimate eroded points (p. 434)
  • Other EDM-based measurements (p. 434)
  • Skeletonization (p. 435)
  • Boundary lines and thickening (p. 437)
  • Combining skeleton and EDM (p. 442)
  • 8 Global Image Measurements (p. 445)
  • Global measurements and stereology (p. 445)
  • Surface area (p. 450)
  • ASTM Grain Size (p. 453)
  • Multiple types of surfaces (p. 456)
  • Length (p. 457)
  • Sampling strategies (p. 459)
  • Determining number (p. 461)
  • Curvature, connectivity, and the disector (p. 462)
  • Anisotropy and gradients (p. 466)
  • Size distributions (p. 469)
  • Classical stereology (unfolding) (p. 471)
  • 9 Feature-Specific Measurements (p. 475)
  • Brightness measurements (p. 475)
  • Determining location (p. 481)
  • Orientation (p. 484)
  • Neighbor relationships (p. 486)
  • Alignment (p. 491)
  • Counting features (p. 496)
  • Special counting procedures (p. 499)
  • Feature size (p. 502)
  • Template matching and correlation (p. 328)
  • Circles and ellipses (p. 505)
  • Caliper dimensions (p. 507)
  • Perimeter (p. 509)
  • Describing shape (p. 512)
  • Fractal dimension (p. 515)
  • Harmonic analysis (p. 519)
  • Topology (p. 522)
  • Three-dimensional measurements (p. 523)
  • 10 Feature Recognition and Classification (p. 527)
  • Template matching and cross-correlation (p. 527)
  • Parametric description (p. 529)
  • Decision points (p. 534)
  • Multidimensional classification (p. 536)
  • Learning systems (p. 541)
  • kNN and cluster analysis (p. 545)
  • Expert systems (p. 549)
  • Neural nets (p. 551)
  • Syntactical models (p. 553)
  • 11 3D Image Acquisition (p. 555)
  • Volume imaging versus sections (p. 555)
  • Basics of reconstruction (p. 558)
  • Algebraic reconstruction methods (p. 563)
  • Maximum entropy (p. 567)
  • Defects in reconstructed images (p. 568)
  • Beam hardening (p. 573)
  • Imaging geometries (p. 578)
  • Three-dimensional tomography (p. 580)
  • High-resolution tomography (p. 587)
  • 12 3D Image Visualization (p. 591)
  • Sources of 3D data (p. 591)
  • Serial sections (p. 592)
  • Optical sectioning (p. 596)
  • Sequential removal (p. 598)
  • Stereo measurement (p. 600)
  • 3D data sets (p. 604)
  • Slicing the data set (p. 606)
  • Arbitrary section planes (p. 611)
  • The use of color (p. 615)
  • Volumetric display (p. 615)
  • Stereo viewing (p. 618)
  • Special display hardware (p. 623)
  • Ray tracing (p. 624)
  • Reflection (p. 628)
  • Surfaces (p. 633)
  • Multiply connected surfaces (p. 639)
  • Image processing in 3D (p. 643)
  • Measurements on 3D images (p. 647)
  • Conclusion (p. 649)
  • 13 Imaging Surfaces (p. 651)
  • Producing surfaces (p. 651)
  • Devices that image surfaces by physical contact (p. 653)
  • Noncontacting measurements (p. 657)
  • Microscopy of surfaces (p. 659)
  • Surface composition imaging (p. 662)
  • Processing of range images (p. 664)
  • Processing of composition maps (p. 668)
  • Profile measurements (p. 683)
  • Data presentation and visualization (p. 669)
  • Rendering and visualization (p. 674)
  • Analysis of surface data (p. 677)
  • The Birmingham measurement suite (p. 687)
  • New approaches--topographic analysis and fractal dimensions (p. 693)
  • References (p. 699)
  • Index (p. 717)

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