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Analyse structurale et chimique des matériaux : diffraction des rayons X, électrons et neutrons : spectrométrie des rayons X, électrons et ions

Main Author Eberhart, Jean-Pierre Country França. Publication Paris : Dunod, cop. 1989 Description XIII, 614 p. : il. ; 26 cm ISBN 2-04-018797-9 CDU 549
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Holdings
Item type Current location Call number Status Date due Barcode Item holds
Monografia Biblioteca Geral da Universidade do Minho
BGUMD 51071 Available 59174
Total holds: 0

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