Selected papers on interference, interferometry, and interferometric metrology / ed. P. Hariharan, Daniel Malacara
Secondary Author
Hariharan, P.
Malacara, Daniel
Country
Estados Unidos.
Publication
Bellingham : SPIE Optical Engineering Press, cop. 1995
Description
XV, 701 p. :
il. ;
28 cm
Series
SPIE milestone series , 110
ISBN
0-8194-1936-2
CDU
535
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