Norris,, L. Friedrick Feasibility study of secondary emission electron microscopy for examining materials containing dispersed oxide particles / L. Friedrick Norris, Walter S. Cremens

Feasibility study of secondary emission electron microscopy for examining materials containing dispersed oxide particles / L. Friedrick Norris, Walter S. Cremens . - Washington : NASA, 1965 . - 48 p. : il. 27 cm . - (NASA TN; D-3650))
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