Norris,, L. Friedrick
Feasibility study of secondary emission electron microscopy for examining materials containing dispersed oxide particles / L. Friedrick Norris, Walter S. Cremens
Feasibility study of secondary emission electron microscopy for examining materials containing dispersed oxide particles / L. Friedrick Norris, Walter S. Cremens
. - Washington : NASA, 1965
. - 48 p. : il. 27 cm
. - (NASA TN; D-3650))
629.73
533.6