Symposium on Developments in Materials Characterization Technologies, Developments in materials characterization technologies / Symposium... ; ed. George F. Vander Voort, John J. Friel

Developments in materials characterization technologies / Symposium... ; ed. George F. Vander Voort, John J. Friel . - Materials Park : ASM International, imp. 1996 . - VII, 125 p. : il. 29 cm
0-87170-580-X (Encadernado)

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