Symposium on Developments in Materials Characterization Technologies,
Developments in materials characterization technologies / Symposium... ; ed. George F. Vander Voort, John J. Friel
Developments in materials characterization technologies / Symposium... ; ed. George F. Vander Voort, John J. Friel
. - Materials Park : ASM International, imp. 1996
. - VII, 125 p. : il. 29 cm
0-87170-580-X (Encadernado)
620.1